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ELORET researchers have worked and published widely in areas related to Materials Characterization and Surface Science. They possess significant experimental and theoretical experience in processes involving different materials including semiconductors, metals, and ceramics.

Surfaces

• gas-surface interactions
• Chemical Vapor Deposition, catalysis, thin film formation and related gas-phase spectroscopy
• the adsorption process, calculation on binding energies and diffusion characteristics for adsorbed atoms
• energy- and structure-related properties for nucleation and early stages of growth

Defects and Impurities

• discrete modeling and investigation of formation, annihilation, and diffusion characteristics of defects
• calculations for local structures and stresses

Simulations for Extreme Conditions

• modeling of properties and processes at extremely high temperatures and pressures
• atomic level investigations for very fast reactions and short time behavior

Material Strength

• responses of materials to external forces
• atomic level simulation of crack formation and propagation
• interaction of impurities with the crack tip
• derivation of potential energy function for simulating specific processes employing molecular dynamics and/or Monte-Carlos techniques

Computational Tools

• large- and micro-scale simulation techniques based on both continuum and atomic modeling procedures, including: direct simulation Monte-Carlos, molecular dynamics, and simulated annealing

Experimental Tools and Techniques for Surface and Bulk Analysis

• ICP - Inductively Coupled Plasma emission for bulk quantitative analysis
• SEM - Secondary Electron Microscopy for detection of microstructure and surface defects (i.e., cracking, melting)
• X-ray crystallography - for detection of crystalline structure of TPS before and after thermal treatment
• EDX - energy dispersive X-ray micro-analysis for qualitative determination of changes in surface chemistry
• thermal diffusivity, thermal conductivity
• IR and UV-VIS absorption, emission, and reflectance
• optical and IR microscopy, IR imaging
• thermal gravimetric analysis